AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Additive manufacturing (AM) encompasses a suite of layer-by-layer fabrication techniques that enable the rapid production of complex geometries from digital models. Central to the industrial adoption ...

A new approach has been uncovered to detail the formation of material defects at the atomic scale and in near-real time, an important step that could assist in engineering better and stronger new ...

COLUMBUS, OH – The difference between an anomaly and a defect in product software can be confusing, but it is important to identify which is which to properly handle problems that crop up in product ...