Around the world, universities have been rethinking not only the medical curriculum but also the entire way of teaching medicine. The enormous torrent of new knowledge, medical specialization, ...
New EVG®40 D2W overlay metrology system provides 100 percent overlay measurement on every die at up to 15X higher throughput versus industry benchmark. EV Group has unveiled the EVG®40 D2W - said to ...
Welcome to the JTAG-IEEE-1149.1 repository! This project provides a basic implementation of the JTAG standard in Verilog, along with integration for a Circuit Under Test (CUT). JTAG, or Joint Test ...
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