Bonds and interconnects are especially problematic and require more test insertions. Ensuring reliability requires connecting fragmented data that is often siloed. The shift to multi-die assemblies is ...
Imagine diagnosing one of the most challenging neurological diseases with just a quick finger-prick, a few drops of blood and ...
Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
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