Abstract: In this paper, we develop a pulsing electrical over stress testing method to simulate different electrical over stress (EOS) in CMOS integrated circuits and the tolerance values ...
Ask the publishers to restore access to 500,000+ books. An icon used to represent a menu that can be toggled by interacting with this icon. A line drawing of the Internet Archive headquarters building ...
Abstract: The article demonstrates the capabilities of the Qucs program used in the educational process of Electrotechnical Universities. The use of free software in Higher Education in Russia is ...
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